Gallery of photographs from Conference on Quantum Metrology 2013.
(Click on the photo below)
You are cordially invited to attend the International Conference on Quantum Metrology (QM) in Poznan, Poland.
The QM 2013 is organized by Poznan University of Technology (Poland) with collaboration with Friedrich-Schiller
University in Jena (Germany).
The aim of the conference is the presentation of results of research and of development,
both theoretical and application, in the quantum metrology. In the intention of organizers the QM
conference has to be a conference, addressed to metrologists and physicists.
We foresee the participation in the conference of guests invited to uttering of short lectures.
The conference language is English. Presentations of reviewed papers will take place on oral
sessions and on a poster session.
The Conference of Quantum Metrology 2013 will be accompanied by an exhibition of research equipment
used in both quantum metrology and nanotechnology.
We invite manufacturers and distributors of measuring apparatus, Scanning Probe Microscopes,
optical, vacuum or precision mechanics devices and other research techniques used in nanotechnology
and quantum metrology to showcase their products and marketing materials during the conference.
Detailed information was placed in the Exhibition item on Menu.
The conference location on Google Maps