4th International Conference on
Quantum Metrology
Poznan, Poland
15th to 17th May, 2013
Poznan University of Technology POLAND
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ARCHIVES - QM 2006 (polish)
ARCHIVES - QM 2008 (polish)
ARCHIVES - QM 2011 (gallery)
ICSES 2014
The Aim of the Conference

Gallery of photographs from Conference on Quantum Metrology 2013.
(Click on the photo below)
Gallery of Conference on Quantum Metrology 2013

You are cordially invited to attend the International Conference on Quantum Metrology (QM) in Poznan, Poland. The QM 2013 is organized by Poznan University of Technology (Poland) with collaboration with Friedrich-Schiller University in Jena (Germany).

The aim of the conference is the presentation of results of research and of development, both theoretical and application, in the quantum metrology. In the intention of organizers the QM conference has to be a conference, addressed to metrologists and physicists. We foresee the participation in the conference of guests invited to uttering of short lectures.

The conference language is English. Presentations of reviewed papers will take place on oral sessions and on a poster session.

The Conference of Quantum Metrology 2013 will be accompanied by an exhibition of research equipment used in both quantum metrology and nanotechnology.
  We invite manufacturers and distributors of measuring apparatus, Scanning Probe Microscopes, optical, vacuum or precision mechanics devices and other research techniques used in nanotechnology and quantum metrology to showcase their products and marketing materials during the conference. Detailed information was placed in the Exhibition item on Menu.

Program of the QM 2013
The conference location on Google Maps

The law on batteries and accumulators
- practical issues
Measurements International
Measurements International

Chair of Telecommunication Systems and Optoelectronics
Faculty of Electronics and Telecommunications
Faculty of Electronics and Telecommunications       Poznan University of Technology
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