You are cordially invited to attend the International Conference on Quantum Metrology (QM) in Poznan, Poland. The QM`2011 is organized by Poznan University of Technology (Poland) and Friedrich Schiller University in Jena (Germany).

An aim of the conference is the presentation of results of research and of development, both theoretical and practical, in the quantum metrology. In the intention of organizers the QM conference is to be a conference, addressed to metrologists and physicists. We foresee the participation in the conference of guests invited to uttering of short lectures.

The conference language is English. Presentations of reviewed papers will take place on plenary sessions, and in the case of the greater number of papers also on a poster session.

The Conference of Quantum Metrology 2011 will be accompanied by an exhibition of research equipment used in both quantum metrology and nanotechnology.
We invite manufacturers and distributors of measuring apparatus, Scanning Probe Microscopes, optical, vacuum or precision mechanics devices and other research techniques used in nanotechnology and quantum metrology to showcase their products and marketing materials during the conference. Detailed information was placed in the Exhibition item on Menu.